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Beilstein J. Nanotechnol. 2016, 7, 1471–1479, doi:10.3762/bjnano.7.139
Figure 1: Typical AFM images of Si substrates before (a) and after (b) ODS-monolayer formation, (c) FAS17-mon...
Figure 2: Typical top-down-view SEM images of sample surfaces: (a) Never Wet, (b) VUV-Never Wet, and (c) Soot...
Figure 3: Traction forces of Coccinella septempunctata beetles measured on different sample surfaces: (a) dat...
Figure 4: Hypothetical wetting behavior of the pad fluid (purple) in the contact region between the tenent se...